Tuning of Structural and Morphological Characteristics of V2O5 Thin Films Using Low Energy 16 keV N+ for Optical and Wetting Applications

Abstract Effect of nitrogen (N+) ion implantation on the morphological, structural, optical, and compositional properties vanadium pentoxide (V2O5) thin films grown glass substrates is studied. Surface morphology shows formation grains growth dynamics governed by roughness (α) (β) exponents. X-ray diffraction studies reveal that V2O5 exists in a hybrid form, with both orthorhombic tetragonal phases. Ion induces defects strain causing reduction crystalline deformation β-phase corresponding change crystallite size. Contact angle wetting are found to be co-related fractal under implantation. Oxygen vacancies electron scattering/trapping centres revealed have increased after N+ implantation, leading smaller bandgap films. The benefits decreasing optical band-gap for applications outlined present work.